Controller for AFM Measurements

Our scanning probe microscopes are using our fully digital controller and our scan software ScanTool™.

C-26 Controller

The specifications of out controller C26 are:

There exist many add-ons to our instruments, depending on the type of desired measurement. One example is our FPGA based Lock-In combination device DiProWa, which supports various electrical measurements like Kelvin-Probe-Force-Microscopy (KFPM).

C-32 Controller

With new controller generation C32 many new features are available: