DS 95 - AFM systems

Our scanners offer highest possible flexibility and a large variety of configuration possibilities.

BRR – AFM-SEM integration

The SEM-AFM is a unification of a scanning electron microscope and an atomic force microscope.
It is exclusively marketed by Carl Zeiss.

Special constructions

We develop instruments for special applications, e.g. ultra high vacuum applications, high temperature measurements, optical nearfield microscopy.